THORNTON AND WALNUT GROVE GAS FIELDS, SACRAMENTO AND SAN JOAQUIN COUNTIES, CALIFORNIA.SILCOX J.1968; A.A.P.G. MEM.; USA; 1968, VOL. 1, NUM. 0009, P. 85 A 92Miscellaneous

REPORT OF A WORKSHOP ON ANALYTICAL ELECTRON MICROSCOPY HELD AT CORNELL UNIVERSITY, ITHACA, NEW YORK, USA, AUGUST 3-6, 1976.ISAACSON MS; SILCOX J.1976; ULTRAMICROSCOPY; NETHERL.; DA. 1976; VOL. 2; NO 1; PP. 89-104; BIBL. 18 REF.Article

DETECTION OF OPTICAL SURFACE GUIDED MODES IN THIN GRAPHITE FILMS BY HIGH-ENERGY ELECTRON SCATTERING.CHEN CH; SILCOX J.1975; PHYS. REV. LETTERS; U.S.A.; DA. 1975; VOL. 35; NO 6; PP. 390-393; BIBL. 12 REF.Article

DIRECT NONVERTICAL INTERBAND TRANSITIONS AT LARGE WAVE VECTORS IN ALUMINUM.CHEN CH; SILCOX J.1977; PHYS. REV., B; U.S.A.; DA. 1977; VOL. 16; NO 10; PP. 4246-4248; BIBL. 6 REF.Article

OXIDE STRUCTURE IN EVAPORATED ALUMINUM FILMS.PETTIT RB; SILCOX J.1974; J. APPL. PHYS.; U.S.A.; DA. 1974; VOL. 45; NO 7; PP. 2858-2866; BIBL. 22 REF.Article

ORIENTATION DEPENDENCE OF CORE EDGES IN ELECTRON-ENERGY-LOSS SPECTRA FROM ANISOTROPIC MATERIALSLEAPMAN RD; SILCOX J.1979; PHYS. REV. LETTERS; USA; DA. 1979; VOL. 42; NO 20; PP. 1361-1364; BIBL. 15 REF.Article

SURFACE GUIDED MODES IN AN ALUMINIUM OXIDE THIN FILM.CHEN CH; SILCOX J.1975; SOLID STATE COMMUNIC.; G.B.; DA. 1975; VOL. 17; NO 3; PP. 273-275; BIBL. 7 REF.Article

CRITICAL THICKNESSES IN SUPERCONDUCTING THIN FILMSDOLAN GJ; SILCOX J.1973; PHYS. REV. LETTERS; U.S.A.; DA. 1973; VOL. 30; NO 13; PP. 603-606; BIBL. 14 REF.Serial Issue

CALCULATIONS OF THE ELECTRON-ENERGY-LOSS PROBABILITY IN THIN UNIAXIAL CRYSTALS AT OBLIQUE INCIDENCECHEN CH; SILCOX J.1979; PHYS. REV., B; ISSN 0163-1829; USA; DA. 1979; VOL. 20; NO 9; PP. 3605-3614; BIBL. 20 REF.Article

ELECTRICAL RESISTIVITY DUE TO DISLOCATIONS IN NICKEL AT LOW TEMPERATURESSCHWERER FC; SILCOX J.1972; PHILOS. MAG.; G.B.; DA. 1972; VOL. 26; NO 5; PP. 1105-1119; BIBL. 1 P.Serial Issue

PLASMON DISPERSION AT LARGE WAVE VECTORS IN AL.BATSON PE; CHEN CH; SILCOX J et al.1976; PHYS. REV. LETTERS; U.S.A.; DA. 1976; VOL. 37; NO 14; PP. 937-940; BIBL. 13 REF.Article

MEASUREMENT OF SURFACE-PLASMON DISPERSION IN OXIDIZED ALUMINUM FILMS.PETTIT RB; SILCOX J; VINCENT R et al.1975; PHYS. REV., B,; U.S.A.; DA. 1975; VOL. 11; NO 8; PP. 3116-3123; BIBL. 34 REF.Article

ELECTRON-ENERGY LOSSES IN SILICON: BULK AND SURFACE PLASMONS AND CERENKOV RADIATION.CHEN CH; SILCOX J; VINCENT R et al.1975; PHYS. REV., B; U.S.A.; DA. 1975; VOL. 12; NO 1; PP. 64-71; BIBL. 23 REF.Article

Experimental energy-loss function, Im[-1/∈(q,ω)], for aluminium = Fonction de perte d'énergie expérimentale, Im[-1/∈(q,ω)], pour l'aluminiumBATSON, P. E; SILCOX, J.Physical review. B, Condensed matter. 1983, Vol 27, Num 9, pp 5224-5239, issn 0163-1829Article

Annular dark-field image simulation of the YBa₂Cu₃O_7-δ/BaF₂ interfaceLEE, J. L; SILCOX, J.Ultramicroscopy. 2000, Vol 84, Num 1-2, pp 65-74, issn 0304-3991Article

Radiation damage of Ni₃Al by 100 keV electronsMULLER, D. A; SILCOX, J.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1995, Vol 71, Num 6, pp 1375-1387, issn 0141-8610Article

PLASMON DISPERSION AND ANISOTROPY IN POLYMERIC SULFUR NITRIDE, (SN)₂CHEN CH; SILCOX J; GARITO AF et al.1976; PHYS. REV. LETTERS; U.S.A.; DA. 1976; VOL. 36; NO 10; PP. 525-528; BIBL. 20 REF.Article

ISSM 2000: Proceedings of the International Symposium on Spectroscopy of Materials, Rottach-Egern, Germany, March 6-10, 2000SIGLE, W; RüHLE, M; SILCOX, J et al.Ultramicroscopy. 2001, Vol 86, Num 3-4, issn 0304-3991, 130 p.Conference Proceedings

Study of the local atomic strain field in a Zr-doped TiAl intermetallic alloy by EXAFS and ab initio FLAPW calculationsPONCHEL, A; HUG, G; JAOUEN, M et al.Ultramicroscopy. 2001, Vol 86, Num 3-4, pp 265-272, issn 0304-3991Conference Paper

Surface X-ray absorption spectroscopy : principles and some examples of applicationsLAGARDE, P.Ultramicroscopy. 2001, Vol 86, Num 3-4, pp 255-263, issn 0304-3991Conference Paper

Transfer of carbetocin into human breast milkSILCOX, J; SCHULZ, P; HORBAY, G. L. A et al.Obstetrics and gynecology (New York. 1953). 1993, Vol 82, Num 3, pp 456-459, issn 0029-7844Article

Simulation of annular dark field STEM images using a modified multislice methodKIRKLAND, E. J; LOANE, R. F; SILCOX, J et al.Ultramicroscopy. 1987, Vol 23, Num 1, pp 77-96, issn 0304-3991Article

A new self-limiting process for the production of thin submicron semiconductor filmsLEE, K. C; SILCOX, J; LEE, C. A et al.Journal of applied physics. 1983, Vol 54, Num 7, pp 4035-4037, issn 0021-8979Article

Observation of oxygen vacancy ordering and segregation in Perovskite oxidesKLIE, R. F; ITO, Y; STEMMER, S et al.Ultramicroscopy. 2001, Vol 86, Num 3-4, pp 289-302, issn 0304-3991Conference Paper

Nanometer width molybdenum selenide fibersHORNBOSTEL, M. D; HILLYARD, S; SILCOX, J et al.Nanotechnology (Bristol. Print). 1995, Vol 6, Num 3, pp 87-92, issn 0957-4484Article